Utilising OLCR (optical low-coherence reflectometry) technology, the AQ7420 high-resolution reflectometer is said to provide a spatial resolution of 40 µm and back reflection measurement sensitivity down to -100 dB or lower.
Combined with the optional sensor head unit, users can measure insertion loss simultaneously alongside back reflection, making the AQ7420 a cost-effective reflectometer for optical market applications.
The new AQ7420 high-resolution reflectometer is available in two models: single-wavelength (1310 nm) and two-wavelength (1310 and 1550 nm).
Also released is control software for Windows 11, an optional dedicated sensor head for loss measurement, various master codes (compatible with a variety of connector types) and a distance adjustment code to adjust the measurement starting position.
Principal among the main new features is the ability of the AQ7420 to reduce spurious noise. With conventional OLCR/OFDR technology-based devices, spurious (ghost) noise is often observable in areas where there is no actual reflection (depending on the characteristics of the equipment), leading to misjudgements. In such situations, correct waveform analysis relies heavily on users with specialist knowledge. In contrast, the new AQ7420 features technology that reduces spurious noise, with ease-of-analysis among its prominent attributes.
Another feature is the potential to measure back reflection and insertion loss simultaneously. Conventional OLCR/OFDR instruments are often unable to inspect back reflection amount accurately due to the poor measurement accuracy of the vertical axis (amount of reflection level). The AQ7420 high-resolution reflectometer is said to counter this issue by enabling measurement with an uncertainty of ±3dB. Furthermore, by taking advantage of the optical sensor head, users can measure insertion loss simultaneously with an uncertainty of ±0.02dB.